probe (rus. зонд) — in the broadest sense means a sensor, sensing element of a measuring, signaling, regulating or controlling device/system that converts the controlled parameter into an easy-to-use signal.


With regard to nanotechnology, the term "probe" generally refers to the microscope tip that interacts with the surface under study.

The design of the probe, its shape and material, are determined by its operation principle and differ for different types of scanning probe microscopes.

The probe most commonly used in scanning tunnelling microscopy is a tungsten needle produced by electrochemical etching. The probe for atomic force microscopy is a micropoint mounted on a flexible microconsole (cantilever). A tip made of magnetic material is used for recording magnetic interactions.


  • Zotov Andrey V.
  • Saranin Alexander A.

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